An edition of Two- and three-dimensional vision systems for inspection, control, and metrology II
(2004)
Two- and three-dimensional vision systems for inspection, control, and metrology II
26-27 October, 2004, Philadelphia, Pennsylvania, USA
by Kevin Harding
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| Edition | Availability |
|---|---|
1
Two- and three-dimensional vision systems for inspection, control, and metrology II: 26-27 October 2004, Philadelphia, Pennsylvania, USA
2005, SPIE
in English
0819455598 9780819455598
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2
Two- and three-dimensional vision systems for inspection, control, and metrology II: 26-27 October, 2004, Philadelphia, Pennsylvania, USA
2004, SPIE
in English
0819455598 9780819455598
|
aaaa
|
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Includes bibliographical references and author index.
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- Created April 1, 2008
- 8 revisions
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| December 30, 2022 | Edited by MARC Bot | import existing book |
| December 11, 2020 | Edited by MARC Bot | import existing book |
| October 8, 2020 | Edited by ImportBot | import existing book |
| August 1, 2020 | Edited by ImportBot | import existing book |
| April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |