An edition of Two- and three-dimensional vision systems for inspection, control, and metrology II
(2004)
Two- and three-dimensional vision systems for inspection, control, and metrology II
26-27 October 2004, Philadelphia, Pennsylvania, USA
by Kevin Harding
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| Edition | Availability |
|---|---|
1
Two- and three-dimensional vision systems for inspection, control, and metrology II: 26-27 October 2004, Philadelphia, Pennsylvania, USA
2005, SPIE
in English
0819455598 9780819455598
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2
Two- and three-dimensional vision systems for inspection, control, and metrology II: 26-27 October, 2004, Philadelphia, Pennsylvania, USA
2004, SPIE
in English
0819455598 9780819455598
|
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|
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- Created November 17, 2008
- 4 revisions
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| July 31, 2019 | Edited by MARC Bot | associate edition with work OL19386359W |
| April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
| April 13, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
| November 17, 2008 | Created by ImportBot | Imported from University of Toronto MARC record |