An edition of Advanced characterization techniques for optics, semiconductors, and nanotechnologies
(2003)
Advanced characterization techniques for optics, semiconductors, and nanotechnologies
3-5 August 2003, San Diego, California, USA
by Angela Duparré
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Previews available in: English
| Edition | Availability |
|---|---|
1
Advanced characterization techniques for optics, semiconductors, and nanotechnologies: 3-5 August 2003, San Diego, California, USA
2004, SPIE
in English
0819450618 9780819450616
|
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2
Advanced characterization techniques for optics, semiconductors, and nanotechnologies: 3-5 August 2003, San Diego, California, USA
2003, SPIE
in English
0819450618 9780819450616
|
aaaa
|
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Includes bibliographical references and index.
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- Created April 1, 2008
- 10 revisions
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| June 11, 2023 | Edited by ImportBot | import existing book |
| January 8, 2023 | Edited by MARC Bot | import existing book |
| December 8, 2020 | Edited by MARC Bot | import existing book |
| October 8, 2020 | Edited by ImportBot | import existing book |
| April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |