An edition of Materials Reliability in Microelectronics III (1993)

Materials Reliability in Microelectronics III

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Materials Reliability in Microelectronics III
Kenneth P. Rodbell, Kenneth P. ...
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Last edited by ImportBot
August 23, 2020 | History
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An edition of Materials Reliability in Microelectronics III (1993)

Materials Reliability in Microelectronics III

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Publish Date
Publisher
University of Cambridge ESOL Examinations
Language
English
Pages
514

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Subjects

Microelectronics, Diffusion, Reliability, Congresses, Materials, Testing, Electrodiffusion, Microstructure
Edition Availability
Cover of: Materials Reliability in Microelectronics III
Materials Reliability in Microelectronics III
2014, University of Cambridge ESOL Examinations
in English
Cover of: Materials Reliability in Microelectronics III
Materials Reliability in Microelectronics III: Symposium Held April 12-15, 1993, San Francisco, California, U.S.A. (Materials Research Society Symposium Proceedings)
October 1993, Materials Research Society
Hardcover in English

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Book Details

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Library of Congress

Edition Identifiers

Open Library
OL29205931M
ISBN 13
9781107409484

Work Identifiers

Work ID
OL9831245W

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August 23, 2020 Created by ImportBot Imported from Better World Books record