Check nearby libraries
Buy this book
![Loading indicator](/images/ajax-loader-bar.gif)
This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.
Check nearby libraries
Buy this book
![Loading indicator](/images/ajax-loader-bar.gif)
Previews available in: English
Showing 1 featured edition. View all 1 editions?
Edition | Availability |
---|---|
1
Transmission Electron Microscopy and Diffractometry of Materials
2002
electronic resource /
in English
- Second Edition.
3662049015 9783662049013
|
aaaa
Libraries near you:
WorldCat
|
Book Details
Table of Contents
Classifications
The Physical Object
ID Numbers
Community Reviews (0)
Feedback?History
- Created July 7, 2019
- 2 revisions
Wikipedia citation
×CloseCopy and paste this code into your Wikipedia page. Need help?
February 27, 2022 | Edited by ImportBot | import existing book |
July 7, 2019 | Created by MARC Bot | Imported from Internet Archive item record |