An edition of Proceedings (2008)

Proceedings

Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy.

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read
Proceedings
IEEE European Test Symposium ( ...
Not in Library

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today
Notes
  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read
Notes

Check nearby libraries

Buy this book

Last edited by WorkBot
December 15, 2009 | History
Edit
An edition of Proceedings (2008)

Proceedings

Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy.

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Conference Pub. Services, IEEE Computer Society
Language
English
Pages
205

Check nearby libraries

Buy this book

Subjects
Testing, Congresses, Integrated circuits

Showing 4 featured editions. View all 4 editions?

Edition Availability
Cover of: Proceedings
Proceedings: Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy.
2008, Conference Pub. Services, IEEE Computer Society
in English
Libraries near you: WorldCat
Cover of: Proceedings
Proceedings: Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy.
2008, Conference Pub. Services, IEEE Computer Society
in English
  • Not in Library
Libraries near you: WorldCat
Cover of: Proceedings
Proceedings: Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy.
2008, Conference Pub. Services, IEEE Computer Society
in English
Libraries near you: WorldCat
Cover of: Proceedings
Proceedings: Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy.
2008, Conference Pub. Services, IEEE Computer Society
in English
Libraries near you: WorldCat

Add another edition?

Book Details

Edition Notes

"IEEE Computer Society Order Number P3150"--t.p. verso.

"ISSN 1530-1877."

Includes bibliographical references and index.

Published in
Los Alamitos, Calif
Genre
Congresses
Other Titles
13th IEEE European Test Symposium, Proceedings of the 13th IEEE European Test Symposium, Thirteenth IEEE European Test Symposium, ETS 2008, European Test Symposium

Classifications

Library of Congress
TK7874 .E7957 2008

The Physical Object

Pagination
xvii, 205 p. :
Number of pages
205

ID Numbers

Open Library
OL23655905M
ISBN 10
0769531504
ISBN 13
9780769531502
LCCN
2009286019

Source records

Library of Congress MARC record

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
December 15, 2009 Edited by WorkBot link works
August 12, 2009 Created by ImportBot Imported from Library of Congress MARC record