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Publish Date
2008
Publisher
Conference Pub. Services,
IEEE Computer Society
Language
English
Pages
205
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Buy this book
Subjects
Testing, Congresses, Integrated circuitsShowing 4 featured editions. View all 4 editions?
Edition | Availability |
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1
Proceedings: Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy.
2008, Conference Pub. Services, IEEE Computer Society
in English
0769531504 9780769531502
|
zzzz
Libraries near you:
WorldCat
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2
Proceedings: Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy.
2008, Conference Pub. Services, IEEE Computer Society
in English
0769531504 9780769531502
|
zzzz
Libraries near you:
WorldCat
|
3
Proceedings: Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy.
2008, Conference Pub. Services, IEEE Computer Society
in English
0769531504 9780769531502
|
aaaa
Libraries near you:
WorldCat
|
4
Proceedings: Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy.
2008, Conference Pub. Services, IEEE Computer Society
in English
0769531504 9780769531502
|
zzzz
Libraries near you:
WorldCat
|
Book Details
Edition Notes
"IEEE Computer Society Order Number P3150"--t.p. verso.
"ISSN 1530-1877."
Includes bibliographical references and index.
Classifications
The Physical Object
ID Numbers
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