Atom-probe field ion microscopy and its applications

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Last edited by MARC Bot
March 30, 2025 | History

Atom-probe field ion microscopy and its applications

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Publish Date
Publisher
Academic Press
Language
English
Pages
299

Buy this book

Previews available in: English

Book Details


Edition Notes

Includes bibliographical references (p. 275-292) and indexes.

Published in
Boston
Series
Advances in electronics and electron physics., 20

Classifications

Dewey Decimal Class
502/.8/2
Library of Congress
QH212.A76 S25 1989, TK7800 .A37 Suppl.20

The Physical Object

Pagination
vii, 299 p. :
Number of pages
299

Edition Identifiers

Open Library
OL2263940M
Internet Archive
atomprobefieldio0000saku
ISBN 10
0120145820
LCCN
89147603
OCLC/WorldCat
19694669
Goodreads
3994070

Work Identifiers

Work ID
OL4844737W

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
March 30, 2025 Edited by MARC Bot import existing book
March 8, 2023 Edited by ImportBot import existing book
November 14, 2022 Edited by ImportBot import existing book
November 10, 2020 Edited by MARC Bot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record