Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

Antireflecting-chromium linewidth standard, S ...
James E. Potzick, James E. Pot ...
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Last edited by VacuumBot
August 8, 2012 | History

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

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Cover of: Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
1997, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
1997, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
1997, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
1997, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
1997, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Microform in English
Cover of: Antireflecting-Chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring Systems
Antireflecting-Chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring Systems
1997, United States Government Printing Office
in English
Cover of: Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
1997, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O
in English
Cover of: Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
1997, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Microform in English

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Book Details


Edition Notes

Distributed to depository libraries in microfiche.

Shipping list no.: 98-0086-M.

Includes bibliographical references (p. 17-18).

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1997] 1 microfiche : negative.

Published in
Gaithersburg, MD, Washington
Series
NIST special publication -- 260-129, Standard reference materials, NIST special publication -- 260-129., Standard reference materials
Other Titles
Antireflecting chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

The Physical Object

Format
Microform
Pagination
xiii, 23 p.
Number of pages
23

ID Numbers

Open Library
OL22389277M

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
August 8, 2012 Edited by VacuumBot Updated format '[microform] /' to 'Microform'; cleaned up pagination
December 15, 2009 Edited by WorkBot link works
November 12, 2008 Created by ImportBot Imported from Binghamton University MARC record