An edition of 1997 IEEE International Conference on Microelectronic Test Structures proceedings
(1997)
1997 IEEE International Conference on Microelectronic Test Structures proceedings
March 17-20, 1997, Monterey, California
by IEEE International Conference on Microel..., Institute of Electrical and Electronics ..., and IEEE Electron Devices Society
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Last edited by Open Library Bot
April 13, 2010 | History
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Subjects
Congresses, Testing, Microelectronics, Integrated circuits, Electronic devices & materials, Engineering measurement & calibration, Electronic Measurements, Technology & Engineering, Technology & Industrial Arts, Science/Mathematics, Electricity, Engineering - Electrical & Electronic, Electronics - Microelectronics| Edition | Availability |
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1
1997 IEEE International Conference on Microelectronics Test Structures Proceedings: March 17-20, 199Y, Monterey, California
April 1997, Institute of Electrical & Electronics Enginee
Paperback
in English
0780332431 9780780332430
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2
1997 IEEE International Conference on Microelectronic Test Structures proceedings: March 17-20, 1997, Monterey, California
1997, IEEE Service Center
in English
0780332431 9780780332430
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Book Details
Edition Notes
"97CH35914."
"97CB35914"--Spine.
Includes bibliographical references and index.
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History
- Created October 29, 2008
- 3 revisions
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| April 13, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
| December 15, 2009 | Edited by WorkBot | link works |
| October 29, 2008 | Created by ImportBot | Imported from University of Toronto MARC record |