An edition of Semiconductor device and failue analysis (2000)

Semiconductor device and failue analysis

using photon emission microscopy

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Cover of: Semiconductor device and failue analysis by Wai Kin Chim
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Last edited by ImportBot
February 23, 2023 | History
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An edition of Semiconductor device and failue analysis (2000)

Semiconductor device and failue analysis

using photon emission microscopy

by

  • 0 Ratings
  • 1 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Wiley
Language
English
Pages
269

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Subjects
Failures, Microscopy, Photon emission, Semiconductors, Testing

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Edition Availability
Cover of: Semiconductor device and failue analysis
Semiconductor device and failue analysis: using photon emission microscopy
2000, Wiley
in English
Libraries near you: WorldCat
Cover of: Semiconductor device and failue analysis
Semiconductor device and failue analysis: using photon emission microscopy
2000, Wiley
in English
  • Not in Library
Libraries near you: WorldCat

Add another edition?

Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Chichester, [England], New York

Classifications

Dewey Decimal Class
621.3815/2
Library of Congress
TK7871.852.C47 2000

The Physical Object

Pagination
xv, 269 p. :
Number of pages
269

ID Numbers

Open Library
OL19020313M
ISBN 10
047149240X
LCCN
00043683
OCLC/WorldCat
44627103
Goodreads
1858322

Source records

Oregon Libraries MARC record
Library of Congress MARC record
Library of Congress MARC record
Better World Books record
amazon.com record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
February 23, 2023 Edited by ImportBot import existing book
September 29, 2021 Edited by ImportBot import existing book
July 28, 2020 Edited by MARC Bot import existing book
April 16, 2010 Edited by bgimpertBot Added goodreads ID.
October 20, 2008 Created by ImportBot Imported from Oregon Libraries MARC record