An edition of Electron beam testing technology (1993)

Electron beam testing technology

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Cover of: Electron beam testing technology by John T. L. Thong
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Last edited by MARC Bot
July 23, 2024 | History
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An edition of Electron beam testing technology (1993)

Electron beam testing technology

by

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Publish Date
Publisher
Plenum Press
Language
English
Pages
462

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Subjects

Electron beams, Semiconductors, Testing, Industrial applications, Scanning electron microscopes, Particle beams
Edition Availability
Cover of: Electron beam testing technology
Electron beam testing technology
1993, Plenum Press
in English

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
New York
Series
Microdevices

Classifications

Dewey Decimal Class
621.3815/48
Library of Congress
TK7871.85 .E426 1993, QC1-75

The Physical Object

Pagination
xvi, 462 p. :
Number of pages
462

Edition Identifiers

Open Library
OL1409878M
ISBN 10
0306443600
LCCN
93018555
OCLC/WorldCat
27725615
Goodreads
3843524

Work Identifiers

Work ID
OL18338543W

Source records

Scriblio MARC record
Library of Congress MARC record
Library of Congress MARC record
Better World Books record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 23, 2024 Edited by MARC Bot import existing book
October 4, 2021 Edited by ImportBot import existing book
November 16, 2020 Edited by MARC Bot import existing book
February 5, 2019 Edited by MARC Bot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record