An edition of Microelectronic failure analysis (1997)

Microelectronic failure analysis

desk reference

3rd ed.

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Microelectronic failure analysis
Thomas W. Lee
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Last edited by MARC Bot
July 25, 2024 | History
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An edition of Microelectronic failure analysis (1997)

Microelectronic failure analysis

desk reference

3rd ed.

by

  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
ASM International
Language
English
Pages
404

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Subjects

Semiconductors, Testing, Microelectronics, Handbooks, manuals, Materials, Defects, Electronics, Electronic apparatus and appliances

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Edition Availability
Cover of: Microelectronic failure analysis
Microelectronic failure analysis: desk reference
1997, ASM International
in English - 3rd ed.
  • Not in Library
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Materials Park, OH
Genre
Handbooks, manuals, etc.

Classifications

Dewey Decimal Class
621.381028/7
Library of Congress
TK7871 .M52 1997, TK7871 .M52 1993

The Physical Object

Pagination
xv, 404 p. :
Number of pages
404

ID Numbers

Open Library
OL1400051M
ISBN 10
087170479X
LCCN
93007792
OCLC/WorldCat
27938247
Goodreads
5108708

Source records

Scriblio MARC record
Library of Congress MARC record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 25, 2024 Edited by MARC Bot import existing book
November 16, 2020 Edited by MARC Bot import existing book
February 18, 2019 Edited by MARC Bot import existing book
April 16, 2010 Edited by bgimpertBot Added goodreads ID.
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record