An edition of Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
(2005)
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
2-4 August, 2005, San Diego, California, USA
by SPIE
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Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II: 2-4 August, 2005, San Diego, California, USA
January 2005, SPIE-International Society for Optical Engine
Paperback
in English
081945883X 9780819458834
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- Created April 30, 2008
- 5 revisions
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| September 10, 2021 | Edited by ImportBot | import existing book |
| December 11, 2020 | Edited by MARC Bot | import existing book |
| April 13, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
| December 15, 2009 | Edited by WorkBot | link works |
| April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |