An edition of Integrated Circuit Metrology, Inspection, and Process Control III
(1989)
Integrated Circuit Metrology, Inspection, and Process Control III
27-28 February 1989, Los Angeles, California (Spie Proceedings, Vol 1087)
by Kevin M. Monahan
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Inspection, Congresses, Integrated circuits, Measurement| Edition | Availability |
|---|---|
1
Integrated circuit metrology, inspection, and process control III: 27-28 February 1989, Los Angeles, California
1989, SPIE
in English
0819401226 9780819401229
|
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2
Integrated Circuit Metrology, Inspection, and Process Control III: 27-28 February 1989, Los Angeles, California (Spie Proceedings, Vol 1087)
July 1989, Society of Photo Optical
Paperback
in English
0819401226 9780819401229
|
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|
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- Created April 30, 2008
- 7 revisions
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| July 24, 2024 | Edited by MARC Bot | import existing book |
| February 17, 2019 | Edited by MARC Bot | import existing book |
| April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
| April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
| April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |