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Subjects
Complementary Metal oxide semiconductors, Congresses, Iddq testing, Metal oxide semiconductors, Complementary, Testing, General Theory of Computing, Storage media & peripherals, Digital Computer Hardware, Computers, Technology & Industrial Arts, Science/Mathematics, General, Logic Design, Computer Engineering, Metal oxide semiconductors, CoShowing 3 featured editions. View all 3 editions?
Edition | Availability |
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1
IEEE International Workshop on IDDQ Testing: digest of papers, November 5-6, 1997, Washington, D.C.
1997, IEEE Computer Society Press
in English
0818681233 9780818681233
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2
IEEE International Workshop on IDDQ Testing: Digest of papers, November 5-6, 1997, Washington, D.C
1997, IEEE Computer Society Press
Unknown Binding
in English
081868125X 9780818681257
|
aaaa
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WorldCat
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3
IEEE International Workshop on Iddq Testing: November 5-6, 1997, Washington, D.C. : Digest of Papers
November 1997, Institute of Electrical & Electronics Enginee
Paperback
in English
0818681233 9780818681233
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zzzz
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WorldCat
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- Created April 30, 2008
- 5 revisions
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1 day ago | Edited by MARC Bot | import existing book |
November 26, 2020 | Edited by MARC Bot | import existing book |
July 31, 2019 | Edited by MARC Bot | associate edition with work OL2769314W |
April 13, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |