An edition of Optical characterization techniques for high-performance microelectronic device manufacturing
(1994)
Optical characterization techniques for high-performance microelectronic device manufacturing
20 October 1994, Austin, Texas
by John Lowell and Ray T. Chen
Share
×Close
Last edited by Scott365Bot
October 23, 2023 | History
vii, 202 p. : 28 cm
Check nearby libraries
Buy this book
Previews available in: English
Subjects
Optical methods, Congresses, Optical pattern recognition, Semiconductors, Testing, Integrated circuits, Design and construction, Semiconductors -- Design and construction -- Congresses, Integrated circuits -- Design and construction -- Congresses, Semiconductors -- Testing -- Optical methods -- Congresses, Integrated circuits -- Testing -- Optical methods -- Congresses, Optical pattern recognition -- Congresses| Edition | Availability |
|---|---|
1
Optical characterization techniques for high-performance microelectronic device manufacturing: 20 October 1994, Austin, Texas
1994, SPIE
in English
0819416703 9780819416704
|
aaaa
|
Book Details
Edition Notes
Includes bibliographical references and author index.
Classifications
The Physical Object
Edition Identifiers
Work Identifiers
Community Reviews (0)
Lists
History
- Created April 1, 2008
- 8 revisions
Wikipedia citation
×CloseCopy and paste this code into your Wikipedia page. Need help?
| October 23, 2023 | Edited by Scott365Bot | import existing book |
| September 30, 2023 | Edited by Scott365Bot | Linking back to Internet Archive. |
| January 17, 2023 | Edited by ImportBot | import existing book |
| January 14, 2023 | Edited by ImportBot | import existing book |
| April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |