Advances and applications in the metallography and characterization of materials and microelectronic components

proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society

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Last edited by MARC Bot
November 24, 2020 | History

Advances and applications in the metallography and characterization of materials and microelectronic components

proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Language
English
Pages
318

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Book Details


Edition Notes

Includes bibliographical references.
Meeting held in Albuquerque, New Mexico, July 23-26, 1995.

Published in
Columbus, Ohio, Materials Park, Ohio
Series
Microstructural science ;, v. 23

Classifications

Dewey Decimal Class
669.95 s, 669/.95
Library of Congress
TN689.2 .I552a vol. 23, TN689.2 .I552a vol. 23

The Physical Object

Pagination
xi, 318 p. :
Number of pages
318

ID Numbers

Open Library
OL1021753M
ISBN 10
0871705702
LCCN
96083825
Goodreads
1946226

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
November 24, 2020 Edited by MARC Bot import existing book
April 16, 2010 Edited by bgimpertBot Added goodreads ID.
April 13, 2010 Edited by Open Library Bot Linked existing covers to the edition.
December 8, 2009 Edited by ImportBot link works
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record