| Record ID | marc_records_scriblio_net/part25.dat:217296848:1269 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part25.dat:217296848:1269?format=raw |
LEADER: 01269cam 2200265 a 4500
001 96083825
003 DLC
005 20041006132601.0
008 960411s1996 ohua b 100 0 eng
010 $a 96083825
020 $a0871705702
040 $aDLC$cDLC$dDLC
050 00 $aTN689.2$b.I552a vol. 23$aTN689.2
082 00 $a669.95 s$a669/.95$220
110 2 $aInternational Metallographic Society.$bTechnical Meeting$n(28th :$d1995 :$cAlbuquerque, New Mexico)
245 10 $aAdvances and applications in the metallography and characterization of materials and microelectronic components :$bproceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society /$cedited by D.W. Stevens ... [et al.].
260 $aColumbus, Ohio :$bInternational Metallographic Society ;$aMaterials Park, Ohio :$bASM International,$cc1996.
300 $axi, 318 p. :$bill. ;$c29 cm.
440 0 $aMicrostructural science ;$vv. 23
500 $aMeeting held in Albuquerque, New Mexico, July 23-26, 1995.
504 $aIncludes bibliographical references.
650 0 $aMetallography$xCongresses.
650 0 $aMetallography$xIndustrial applications$xCongresses.
650 0 $aMicroelectronics$xMaterials$xMicroscopy$xCongresses.
700 1 $aStevens, D. W.