Jürgen Beyerer

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Pattern Recognition: Introduction, Features, Classifiers and Principles

by Jürgen Beyerer, Matthias Richter, and Matthias Nagel First published in 2017 — 6 editions

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Machine Learning for Cyber Physical Systems: Selected Papers from the International Conference ML4CPS 2015

by Jürgen Beyerer, Oliver Niggemann, and Christian Kühnert First published in 2015 — 5 editions

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Automatische Sichtprüfung: Grundlagen, Methoden und Praxis der Bildgewinnung und Bildauswertung

by Jürgen Beyerer, Fernando Puente León, Christian Frese, and Johannes Meyer First published in 2012 — 5 editions

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Machine Learning for Cyber-Physical Systems: Selected Papers from the International Conference ML4CPS 2023

by Jürgen Beyerer, Alexander Maier, and Oliver Niggemann First published in 2016 — 4 editions

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Machine Vision : Automated Visual Inspection: Theory, Practice and Applications

by Jürgen Beyerer, Fernando Puente León, and Christian Frese First published in 2015 — 3 editions

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Ingenieurwissen: Entwicklung, Konstruktion und Produktion

by Karl-Heinrich Grote, Frank Engelmann, Wolfgang Beitz, Max Syrbe, and Jürgen Beyerer First published in 2014 — 1 edition

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Das Ingenieurwissen: Entwicklung, Konstruktion und Produktion

by Karl-Heinrich Grote, Frank Engelmann, Wolfgang Beitz, Max Syrbe, Jürgen Beyerer, and Günter Spur First published in 2014 — 1 edition

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Proceedings of the 2019 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory

by Jürgen Beyerer and Tim Zander First published in 2020 — 1 edition

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OCM 2021 - Optical Characterization of Materials: Conference Proceedings

by Jürgen Beyerer and Thomas Längle First published in 2021 — 1 edition

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Proceedings of the 2020 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory

by Jürgen Beyerer and Tim Zander First published in 2021 — 1 edition

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Automated Visual Inspection and Machine Vision

by Jürgen Beyerer and Fernando Puente León First published in 2015 — 1 edition

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Automated Visual Inspection and Machine Vision II

by Jürgen Beyerer and Fernando Puente León First published in 2017 — 1 edition

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OLID: OL7836605A

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Created April 23, 2020
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April 23, 2020

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Jürgen Beyerer

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