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Last edited by ImportBot
December 4, 2010 | History

Zu-Han Gu

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  • Cover of: Surface scattering and diffraction for advanced metrology: 1 August 2001, San Diego, USA

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  • Cover of: Scattering and surface roughness III: 1-2 August 2000, San Diego, USA

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  • Cover of: Scattering and surface roughness II: 21-23 July 1998, San Diego, California

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  • Cover of: Scattering and surface roughness: 30-31 July 1997, San Diego, California

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  • Cover of: Rough Surface Scattering and Contamination: 21-23 July 1999, Denver, Colorado (Proceedings of Spie--the International Society for Optical Engineering, V. 3784.)

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  • Cover of: Surface scattering and diffraction for advanced metrology II: 9 July, 2002, Seattle, Washington, USA

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  • Cover of: Surface scattering and diffraction III: 4-6 August, 2003, San Diego, California, USA

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  • Cover of: Reflection, scattering, and diffraction from surfaces II: 2-4 August 2010, San Diego, California, United States

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  • Cover of: Reflection, scattering, and diffraction from surfaces: 11-12 August 2008, San Diego, California, USA

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December 4, 2010 Created by ImportBot new author