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Surface scattering and diffraction for advanced metrology II: 9 July, 2002, Seattle, Washington, USA
Subjects
Congresses, Measurement, Surface roughness, Scattering (Physics), Diffractive scattering, Metrology, Optical measurements, Scattering (physics), Light, Scattering, Electromagnetic waves, Surfaces (technology), Light, scattering, Contamination, Optics, Space vehicles, Surface chemistry, Surface contamination, Surfaces (physics), Weights and measuresID Numbers
- OLID: OL6864712A
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December 4, 2010 | Created by ImportBot | new author |