An edition of 1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (1997)

1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems

October 20-22, 1997 Paris, France

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Cover of: 1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems by IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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Last edited by MARC Bot
December 10, 2009 | History
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An edition of 1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (1997)

1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems

October 20-22, 1997 Paris, France

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Institute of Electrical & Electronics Enginee
Language
English
Pages
314

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Edition Availability
Cover of: 1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems
1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems: October 20-22, 1997 Paris, France
October 1997, Institute of Electrical & Electronics Enginee
Paperback in English
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Book Details

The Physical Object

Format
Paperback
Number of pages
314
Dimensions
8.8 x 6 x 0.5 inches
Weight
15.2 ounces

ID Numbers

Open Library
OL11390485M
ISBN 10
0818681683
ISBN 13
9780818681684
OCLC/WorldCat
37968774
Goodreads
3328283

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July 12, 2024 Edited by MARC Bot import existing book
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page