An edition of Electronics reliability and measurement technology (1987)

Electronics Reliability and Measurement Technology

Nondestructive Evaluation

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Cover of: Electronics Reliability and Measurement Technology by Joseph S. Heyman, Joseph S. Heyman
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Last edited by Open Library Bot
December 3, 2010 | History
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An edition of Electronics reliability and measurement technology (1987)

Electronics Reliability and Measurement Technology

Nondestructive Evaluation

by

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Publish Date
Publisher
Noyes Publications
Language
English
Pages
128

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Subjects

Electronics, Reliability

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Edition Availability
Cover of: Electronics Reliability and Measurement Technology
Electronics Reliability and Measurement Technology: Nondestructive Evaluation
March 1, 1989, Noyes Publications
Hardcover in English
  • Not in Library
Libraries near you: WorldCat
Cover of: Electronics reliability and measurement technology
Electronics reliability and measurement technology: proceedings of a conference sponsored by the NASA Langley Research Center, Hampton, Virginia, U.S. Air Force Space Division, Los Angeles, California, the National Security Industrial Association, Washington, D.C. and the Aerospace Industry Association, Washington, D.C., and held at Langley Research Center, June 3-5, 1986
1987, Langley Research Center

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Book Details

The Physical Object

Format
Hardcover
Number of pages
128

ID Numbers

Open Library
OL8048745M
ISBN 10
081551171X
ISBN 13
9780815511717
Library Thing
8739385
Goodreads
4594176

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History

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December 3, 2010 Edited by Open Library Bot Added subjects from MARC records.
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page