An edition of Techniques for measuring the integrity of passivation overcoats on integrated circuits (1977)

Techniques for measuring the integrity of passivation overcoats on integrated circuits

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Techniques for measuring the integrity of pas ...
Kern, Werner
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Last edited by Open Library Bot
December 5, 2010 | History
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An edition of Techniques for measuring the integrity of passivation overcoats on integrated circuits (1977)

Techniques for measuring the integrity of passivation overcoats on integrated circuits

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  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Language
English
Pages
105

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Subjects
Integrated circuits, Microelectronics, Passivation, Protective coatings, Quality control, Testing

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Edition Availability
Cover of: Techniques for measuring the integrity of passivation overcoats on integrated circuits
Techniques for measuring the integrity of passivation overcoats on integrated circuits
1977, U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
in English
  • Not in Library
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Book Details

Edition Notes

Includes bibliographical references.

Published in
Washington
Series
Semiconductor measurement technology, National Bureau of Standards special publication ; 400-31, NBS special publication ;, 400-31.

Classifications

Dewey Decimal Class
602/.1 s, 621.381/73
Library of Congress
QC100 .U57 no. 400-31, TK7874 .U57 no. 400-31

The Physical Object

Pagination
xiv, 105 p. :
Number of pages
105

ID Numbers

Open Library
OL5016489M
LCCN
76608229
OCLC/WorldCat
2389925

Source records

Library of Congress MARC record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON
December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page