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Last edited by Open Library Bot
December 5, 2010 | History

Techniques for measuring the integrity of passivation overcoats on integrated circuits 1 edition

Techniques for measuring the integrity of passivation overcoats on int ...
Kern, Werner

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Techniques for measuring the integrity of passivation overcoats on integrated circuits
Werner Kern and Robert B. Comizzoli.

Published 1977 by U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off. in Washington .
Written in English.

Edition Notes

Includes bibliographical references.

Series
Semiconductor measurement technology, National Bureau of Standards special publication ; 400-31, NBS special publication ;, 400-31.

Classifications

Dewey Decimal Class
602/.1 s, 621.381/73
Library of Congress
QC100 .U57 no. 400-31, TK7874 .U57 no. 400-31

The Physical Object

Pagination
xiv, 105 p. :
Number of pages
105

ID Numbers

Open Library
OL5016489M
LC Control Number
76608229

History

Download catalog record: RDF / JSON
December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page