Techniques for measuring the integrity of passivation overcoats on integrated circuits

Techniques for measuring the integrity of pas ...
Kern, Werner, Kern, Werner
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Last edited by MARC Bot
November 15, 2023 | History

Techniques for measuring the integrity of passivation overcoats on integrated circuits

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Edition Availability
Cover of: Techniques for measuring the integrity of passivation overcoats on integrated circuits
Techniques for measuring the integrity of passivation overcoats on integrated circuits
1977, U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
in English

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Book Details


Edition Notes

Includes bibliographical references.

Published in
Washington
Series
Semiconductor measurement technology, National Bureau of Standards special publication ; 400-31, NBS special publication ;, 400-31.

Classifications

Dewey Decimal Class
602/.1 s, 621.381/73
Library of Congress
QC100 .U57 no. 400-31, TK7874 .U57 no. 400-31

The Physical Object

Pagination
xiv, 105 p. :
Number of pages
105

Edition Identifiers

Open Library
OL5016489M
LCCN
76608229
OCLC/WorldCat
2389925

Work Identifiers

Work ID
OL6985978W

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
November 15, 2023 Edited by MARC Bot import existing book
October 12, 2020 Edited by MARC Bot import existing book
December 14, 2009 Edited by WorkBot link works
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record