Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script

Defects in PN junctions and MOS capacitors ob ...
Martin G. Buehler, Martin G. B ...
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Last edited by MARC Bot
November 15, 2023 | History

Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script

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Cover of: Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script
Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script
1976, U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
in English

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Book Details


Edition Notes

Bibliography: p. 14.

Published in
Washington
Series
Semiconductor measurement technology, NBS special publication ; 400-26, NBS special publication ;, 400-26.

Classifications

Dewey Decimal Class
602/.1 s, 621.3815/28
Library of Congress
QC100 .U57 no. 400-26, TK7871.85 .U57 no. 400-26

The Physical Object

Pagination
iii, 14 p. :
Number of pages
14

ID Numbers

Open Library
OL5016371M
LCCN
76608059
OCLC/WorldCat
2075303, 2217236

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History

Download catalog record: RDF / JSON
November 15, 2023 Edited by MARC Bot import existing book
December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page