Trace analysis of semiconductor materials.

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Last edited by ImportBot
January 6, 2023 | History

Trace analysis of semiconductor materials.

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Previews available in: English

Edition Availability
Cover of: Trace Analysis of Semiconductor Materials
Trace Analysis of Semiconductor Materials: International Series of Monographs on Analytical Chemistry
2013, Elsevier Science & Technology Books
in English
Cover of: Trace analysis of semiconductor materials
Cover of: Trace analysis of semiconductor materials
Trace analysis of semiconductor materials
1964-01-01, Pergamon Press; [distributed in the Western Hemisphere by Macmillan, New York]
Cover of: Trace analysis of semiconductor materials.
Trace analysis of semiconductor materials.
1964, Pergamon Press; [distributed in the Western Hemisphere by Macmillan, New York]
in English

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Book Details


Edition Notes

Includes bibliographies.

Published in
Oxford, New York
Series
International series of monographs on analytical chemistry,, v. 11, International series of monographs on analytical chemistry ;, v. 11.

Classifications

Dewey Decimal Class
541.377
Library of Congress
QD939 .C26 1964

The Physical Object

Pagination
ix, 282 p.
Number of pages
282

Edition Identifiers

Open Library
OL5886447M
LCCN
63018922
OCLC/WorldCat
1100371

Work Identifiers

Work ID
OL6681463W

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History

Download catalog record: RDF / JSON
January 6, 2023 Edited by ImportBot import existing book
November 28, 2012 Edited by AnandBot Fixed spam edits.
November 23, 2012 Edited by 188.120.235.38 Edited without comment.
December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page