Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing

August 7-8, 2000, San Jose, California

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Last edited by Open Library Bot
December 10, 2009 | History

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing

August 7-8, 2000, San Jose, California

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Language
English
Pages
131

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Previews available in: English

Edition Availability
Cover of: Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing

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Book Details


Edition Notes

Includes bibliographical references and author index.
"IEEE Computer Society Order Number PR00689"--T.p. verso.
"This is the 8th year of this exciting event"--P. viii.
Also available via the World Wide Web with additional title: Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.

Published in
Los Alamitos, Calif
Genre
Congresses.
Other Titles
Records of the IEEE International Workshop on Memory Technology, Design and Testing 2000, Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.

Classifications

Dewey Decimal Class
621.39/732
Library of Congress
TK7895.M4 I334 2000

The Physical Object

Pagination
x, 131 p. :
Number of pages
131

ID Numbers

Open Library
OL3965819M
Internet Archive
recordsieeeinter00tech
ISBN 10
0769506895, 0769506909, 0769506917
LCCN
2001270775
OCLC/WorldCat
44843886
Goodreads
3523683

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History

Download catalog record: RDF / JSON
December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page