Advances and applications in the metallography and characterization of materials and microelectronic components

proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society

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Last edited by Open Library Bot
December 4, 2010 | History

Advances and applications in the metallography and characterization of materials and microelectronic components

proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Language
English
Pages
318

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Book Details


Edition Notes

Includes bibliographical references.
Meeting held in Albuquerque, New Mexico, July 23-26, 1995.

Published in
Columbus, Ohio, Materials Park, Ohio
Series
Microstructural science ;, v. 23

Classifications

Dewey Decimal Class
669.95 s, 669/.95
Library of Congress
TN689.2 .I552a vol. 23, TN689.2 .I552a vol. 23

The Physical Object

Pagination
xi, 318 p. :
Number of pages
318

ID Numbers

Open Library
OL1021753M
ISBN 10
0871705702
LCCN
96083825
Goodreads
1946226

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History

Download catalog record: RDF / JSON
December 4, 2010 Edited by Open Library Bot Added subjects from MARC records.
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 8, 2009 Created by ImportBot add works page