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Subjects
Electron microscopy, Congresses, Defects, Proton beams, Crystals, Particle beamsEdition | Availability |
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Advanced photon and particle techniques for the characterization of defects in solids: symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A.
1985, Materials Research Society
in English
0091837065 9780091837068
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Includes bibliographies and indexes.
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