| Record ID | marc_uic/UIC_2022.mrc:169654457:1339 |
| Source | marc_uic |
| Download Link | /show-records/marc_uic/UIC_2022.mrc:169654457:1339?format=raw |
LEADER: 01339cam a2200361 a 4500
001 9943972512005897
005 20200411140519.0
008 850306s1985 paua b 10100 eng
020 $a0091837065
035 $a7409124-01carli_network
035 $a(OCoLC)ocm11842600
035 $9ADO-8770
035 $a(UIUdb)870028
035 $a(EXLNZ-01CARLI_NETWORK)991118685969705816
039 0 $a2$b3$c3$d3$e3
040 $aDLC$cDLC$dUIU$dUIUdb
050 0 $aQD921$b.A27 1985
082 0 $a620.1/127$219
245 00 $aAdvanced photon and particle techniques for the characterization of defects in solids :$bsymposium held November 27-29, 1984, Boston, Massachusetts, U.S.A. /$ceditors, J.B. Roberto, R.W. Carpenter, M.C. Wittels.
260 0 $aPittsburgh, Pa. :$bMaterials Research Society,$cc1985.
300 $axi, 390 p. :$bill. ;$c24 cm.
440 0 $aMaterials Research Society symposia proceedings,$x0272-9172 ;$vv. 41
504 $aIncludes bibliographies and indexes.
650 0 $aCrystals$xDefects$xCongresses.
650 0 $aProton beams$xCongresses.
650 0 $aParticle beams$xCongresses.
650 0 $aElectron microscopy$xCongresses.
700 10 $aRoberto, J. B.
700 10 $aWittels, M. C.
700 10 $aCarpenter, R. W.
959 $a(UIUdb)870028
959 $a(UICdb)439725$9LOCAL
976 $a38198300019435