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Subjects
Semiconductors, Failures, Reliability, CongressesShowing 2 featured editions. View all 2 editions?
Edition | Availability |
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1
Degradation Mechanisms in III-V Compound Semiconductor Devices and Structures: Volume 184
2014, University of Cambridge ESOL Examinations
in English
1107410142 9781107410145
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2
Degradation mechanisms in III-V compound semiconductor devices and structures: symposium held April 17-18, 1990, San Francisco, California, U.S.A.
1990, Materials Research Society
in English
1558990739 9781558990739
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Book Details
Edition Notes
Includes bibliographical references and indexes.
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Feedback?November 11, 2020 | Edited by MARC Bot | import existing book |
July 31, 2020 | Created by ImportBot | import existing book |