An edition of Digital circuit testing and testability (1997)

Digital circuit testing and testability

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Cover of: Digital circuit testing and testability by Parag K. Lala, Parag K. Lala
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  • 68 Want to read
  • 11 Currently reading
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Last edited by ImportBot
September 17, 2024 | History
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An edition of Digital circuit testing and testability (1997)

Digital circuit testing and testability

by

  • 68 Want to read
  • 11 Currently reading

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Publish Date
Publisher
Academic Press
Language
English
Pages
199

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Previews available in: English

Subjects

Integrated circuits, Testing, Very large scale integration, Digital integrated circuits, Fault tolerance, Integrated circuits, very large scale integration

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Edition Availability
Cover of: Digital circuit testing and testability
Digital circuit testing and testability
1997, Academic Press
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
San Diego

Classifications

Dewey Decimal Class
621.39/5/0287
Library of Congress
TK7874.75 .L35 1997, TK7874.75.L35 1997

The Physical Object

Pagination
xii, 199 p. :
Number of pages
199

ID Numbers

Open Library
OL1002781M
Internet Archive
digitalcircuitte0000lala
ISBN 10
0124343309
LCCN
96042114
OCLC/WorldCat
35317862
Library Thing
3368825
Goodreads
3248565

Source records

Library of Congress MARC record
Internet Archive item record
Promise Item
marc_columbia MARC record
Better World Books record

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History

Download catalog record: RDF / JSON
September 17, 2024 Edited by ImportBot import existing book
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
February 2, 2010 Edited by WorkBot add more information to works
December 9, 2009 Created by WorkBot add works page