An edition of Spectroscopic characterization techniques for semiconductor technology II (1985)

Spectroscopic characterization techniques for semiconductor technology II

January 21-22, 1985, Los Angeles, California

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Cover of: Spectroscopic characterization techniques for semiconductor technology II by Fred H. Pollak, chairman/editor.
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Last edited by MARC Bot
April 3, 2019 | History
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An edition of Spectroscopic characterization techniques for semiconductor technology II (1985)

Spectroscopic characterization techniques for semiconductor technology II

January 21-22, 1985, Los Angeles, California

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
SPIE--the International Society for Optical Engineering
Language
English
Pages
169

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Previews available in: English

Subjects
Spectrum analysis, Semiconductors, Testing, Congresses
Edition Availability
Cover of: Spectroscopic characterization techniques for semiconductor technology II
Spectroscopic characterization techniques for semiconductor technology II: January 21-22, 1985, Los Angeles, California
1985, SPIE--the International Society for Optical Engineering
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographies and index.

Published in
Bellingham, Wash., USA
Series
Proceedings of SPIE--the International Society for Optical Engineering -- v. 524

Classifications

Library of Congress
TK7871.85 .S725 1985

The Physical Object

Pagination
vi, 169 p. :
Number of pages
169

ID Numbers

Open Library
OL14089148M
Internet Archive
isbn_0892525592_524
ISBN 10
0892525592
LCCN
85050424
OCLC/WorldCat
12307424

Source records

Western Washington University MARC record
Internet Archive item record
marc_columbia MARC record

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April 3, 2019 Created by MARC Bot import existing book