An edition of Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II (1998)

Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II

29-30 January 1998, San Jose, California

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Cover of: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II by John C. Stover, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering.
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Last edited by ImportBot
August 4, 2020 | History
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An edition of Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II (1998)

Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II

29-30 January 1998, San Jose, California

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
SPIE
Language
English
Pages
186

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Previews available in: English

Subjects
Flatness measurement, Surface roughness, Congresses, Semiconductor wafers, Measurement, Optical materials, Optical data processing

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Edition Availability
Cover of: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II
Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II: 29-30 January 1998, San Jose, California
1998, SPIE
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash., USA
Series
SPIE proceedings series ;, v. 3275, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 3275.

Classifications

Dewey Decimal Class
621.3815/2
Library of Congress
TK7871.85 .F6223 1998, TK7871.85.F6223 1998

The Physical Object

Pagination
vii, 186 p. :
Number of pages
186

ID Numbers

Open Library
OL464999M
Internet Archive
isbn_0819427144_3275
ISBN 10
0819427144
LCCN
98184987
OCLC/WorldCat
38957879
Goodreads
745742

Source records

Scriblio MARC record
Better World Books record
Library of Congress MARC record
Internet Archive item record
marc_columbia MARC record

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August 4, 2020 Edited by ImportBot import existing book
March 12, 2019 Created by MARC Bot import existing book