An edition of X-ray diffraction at elevated temperatures (1993)

X-ray diffraction at elevated temperatures

a method for in situ process analysis

by

Cover of: X-ray diffraction at elevated temperatures by Deborah D. L. Chung
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Last edited by ImportBot
October 18, 2022 | History
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An edition of X-ray diffraction at elevated temperatures (1993)

X-ray diffraction at elevated temperatures

a method for in situ process analysis

by

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Publish Date
Publisher
VCH
Language
English
Pages
268

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Subjects

X-rays, Diffraction, Industrial applications, X-rays, diffraction, X-rays, industrial applications
Edition Availability
Cover of: X-ray diffraction at elevated temperatures
X-ray diffraction at elevated temperatures: a method for in situ process analysis
1993, VCH
in English

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
New York

Classifications

Dewey Decimal Class
548/.83
Library of Congress
QC482.D5 X74 1993, QC482.D5.X74 1993, QC482.D5 X74 1992

The Physical Object

Pagination
viii, 268 p. :
Number of pages
268

Edition Identifiers

Open Library
OL1718984M
ISBN 10
0895737450, 3527278427
LCCN
92021803
OCLC/WorldCat
26502034
Goodreads
4920340

Work Identifiers

Work ID
OL19210235W

Source records

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History

Download catalog record: RDF / JSON
October 18, 2022 Edited by ImportBot import existing book
March 11, 2019 Created by MARC Bot import existing book