X-ray diffraction at elevated temperatures

a method for in situ process analysis

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Last edited by ImportBot
October 18, 2022 | History

X-ray diffraction at elevated temperatures

a method for in situ process analysis

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  • 0 Have read

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Publish Date
Publisher
VCH
Language
English
Pages
268

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Edition Availability
Cover of: X-ray diffraction at elevated temperatures

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Book Details


Edition Notes

Includes bibliographical references and index.

Published in
New York

Classifications

Dewey Decimal Class
548/.83
Library of Congress
QC482.D5 X74 1993, QC482.D5.X74 1993, QC482.D5 X74 1992

The Physical Object

Pagination
viii, 268 p. :
Number of pages
268

ID Numbers

Open Library
OL1718984M
ISBN 10
0895737450, 3527278427
LCCN
92021803
OCLC/WorldCat
26502034
Goodreads
4920340

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History

Download catalog record: RDF / JSON
October 18, 2022 Edited by ImportBot import existing book
March 11, 2019 Created by MARC Bot import existing book