An edition of VLSI test principles and architectures
(2006)
VLSI test principles and architectures
design for testability
by Laung-Terng Wang, Xiaoqing Wen, and Cheng-Wen Wu
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Previews available in: English
| Edition | Availability |
|---|---|
1
VLSI test principles and architectures: design for testability
2006, Elsevier Morgan Kaufmann Publishers, Morgan Kaufmann
in English
0123705975 9780123705976
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2
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
July 7, 2006, Morgan Kaufmann
in English
0123705975 9780123705976
|
zzzz
|
3
VLSI Test Principles and Architectures: Design for Testability
2006, Elsevier Science & Technology Books
in English
0080474799 9780080474793
|
zzzz
|
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Includes bibliographical references and index
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| December 14, 2020 | Edited by MARC Bot | import existing book |
| August 1, 2020 | Edited by ImportBot | import existing book |
| July 30, 2019 | Edited by MARC Bot | associate edition with work OL19124870W |
| July 8, 2019 | Edited by MARC Bot | import existing book |
| March 10, 2019 | Created by MARC Bot | import existing book |