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Previews available in: English
Edition | Availability |
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1
VLSI test principles and architectures: design for testability
2006, Elsevier Morgan Kaufmann Publishers, Morgan Kaufmann
in English
0123705975 9780123705976
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2
VLSI Test Principles and Architectures: Design for Testability
2006, Elsevier Science & Technology Books
in English
0080474799 9780080474793
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zzzz
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3
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
July 7, 2006, Morgan Kaufmann
in English
0123705975 9780123705976
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- Created April 29, 2008
- 6 revisions
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July 30, 2019 | Edited by MARC Bot | associate edition with work OL19124870W |
August 5, 2010 | Edited by IdentifierBot | added LibraryThing ID |
April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |