VLSI Test Principles and Architectures

Design for Testability (Systems on Silicon)

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Last edited by MARC Bot
July 30, 2019 | History

VLSI Test Principles and Architectures

Design for Testability (Systems on Silicon)

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Publish Date
Publisher
Morgan Kaufmann
Language
English
Pages
808

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Previews available in: English

Edition Availability
Cover of: VLSI test principles and architectures
VLSI test principles and architectures: design for testability
2006, Elsevier Morgan Kaufmann Publishers, Morgan Kaufmann
in English
Cover of: VLSI Test Principles and Architectures
VLSI Test Principles and Architectures: Design for Testability
2006, Elsevier Science & Technology Books
in English
Cover of: VLSI Test Principles and Architectures
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
July 7, 2006, Morgan Kaufmann
in English

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Book Details


Edition Identifiers

Open Library
OL7327412M
ISBN 10
0123705975
ISBN 13
9780123705976
LibraryThing
8722884
Goodreads
941344

Work Identifiers

Work ID
OL19124870W

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 30, 2019 Edited by MARC Bot associate edition with work OL19124870W
August 5, 2010 Edited by IdentifierBot added LibraryThing ID
April 24, 2010 Edited by Open Library Bot Fixed duplicate goodreads IDs.
April 16, 2010 Edited by bgimpertBot Added goodreads ID.
April 29, 2008 Created by an anonymous user Imported from amazon.com record