An edition of Diagnostic techniques for semiconductor materials processing
(1994)
Diagnostic techniques for semiconductor materials processing
symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.
by G. M. Crean and Orest J. Glembocki
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Semiconductors, Testing, Congresses| Edition | Availability |
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1
Diagnostic techniques for semiconductor materials processing: symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.
1994, Materials Research Society
in English
1558992235 9781558992238
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Book Details
Edition Notes
Includes bibliographical references and indexes.
Papers presented at the symposium held as part of the 1993 Fall Meeting of the Materials Research Society in Boston, Mass.
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| July 31, 2020 | Edited by ImportBot | import existing book |
| February 18, 2019 | Created by MARC Bot | import existing book |