Optical measurement systems for industrial inspection III

23-26 June 2003, Munich, Germany

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Last edited by ImportBot
August 1, 2020 | History

Optical measurement systems for industrial inspection III

23-26 June 2003, Munich, Germany

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
SPIE
Language
English
Pages
896

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Previews available in: English

Book Details


Edition Notes

Includes bibliographical references and index.
At head of title: proceedings of SPIE, SPIE--the Society for Optical Engineering.
"Sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)."

Published in
Bellingham, Wash
Series
SPIE proceedings series,, v. 5144, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 5144.
Genre
Congresses.

Classifications

Library of Congress
TS156.2 .O6543 2003, TS156.2.O6543 2003

The Physical Object

Pagination
xviii, 896 p. :
Number of pages
896

ID Numbers

Open Library
OL3324608M
ISBN 10
0819450146
LCCN
2004297769
OCLC/WorldCat
52578632
Goodreads
4101021

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History

Download catalog record: RDF / JSON
August 1, 2020 Edited by ImportBot import existing book
February 17, 2019 Created by MARC Bot import existing book