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Optical measurement systems for industrial inspection III: 23-26 June 2003, Munich, Germany
2003, SPIE
in English
0819450146 9780819450142
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Edition Notes
Includes bibliographical references and index.
At head of title: proceedings of SPIE, SPIE--the Society for Optical Engineering.
"Sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)."
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Feedback?August 1, 2020 | Edited by ImportBot | import existing book |
February 17, 2019 | Created by MARC Bot | import existing book |