An edition of Applied scanning probe methods IX (2008)

Applied scanning probe methods IX

characterization

by and

Cover of: Applied scanning probe methods IX by Bharat Bhushan, H. Fuchs
Locate

My Reading Lists:

Create a new list

Notes
Notes

Check nearby libraries

Buy this book

Last edited by ImportBot
August 2, 2020 | History
Edit
An edition of Applied scanning probe methods IX (2008)

Applied scanning probe methods IX

characterization

by and

This work doesn't have a description yet. Can you add one?

Publish Date
Publisher
Springer
Language
English
Pages
387

Check nearby libraries

Buy this book

Subjects

Materials, Scanning probe microscopy, Industrial applications, Microscopy, Materials, microscopy
Edition Availability
Cover of: Applied scanning probe methods IX
Applied scanning probe methods IX: characterization
2008, Springer
in English

Add another edition?

Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Berlin, New York
Series
Nanoscience and technology
Other Titles
Applied scanning probe methods 9, Applied scanning probe methods nine

Classifications

Library of Congress
TA417.23 .A655 2008b, T174.7QC450-467QC718

The Physical Object

Pagination
lix, 387 p. :
Number of pages
387

Edition Identifiers

Open Library
OL23157823M
ISBN 10
3540740821
ISBN 13
9783540740827
LCCN
2007937293
OCLC/WorldCat
180479025

Work Identifiers

Work ID
OL18624497W

Source records

Library of Congress MARC record
Library of Congress MARC record
Library of Congress MARC record
Internet Archive item record
Better World Books record
Library of Congress MARC record
Promise Item
Harvard University record

Community Reviews (0)

No community reviews have been submitted for this work.

Lists

Loading indicator
Loading carousel
Loading indicator
Loading carousel

History

Download catalog record: RDF / JSON
August 2, 2020 Edited by ImportBot import existing book
June 28, 2019 Edited by MARC Bot import existing book
February 9, 2019 Created by MARC Bot import existing book