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Publish Date
2002
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Language
English
Pages
19
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Distributed testing of a device-level interface specification for a metrology system
2002, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Microform
in English
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Edition Notes
"January 2002."
Shipping list no.: 2002-0384-M.
Includes bibliographical references (p. 19).
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002. 1 microfiche : negative.
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