Three-dimensional imaging, optical metrology, and inspection V

19-20 September 1999, Boston, Massachusetts

My Reading Lists:

Create a new list



Buy this book

Last edited by ImportBot
July 31, 2020 | History

Three-dimensional imaging, optical metrology, and inspection V

19-20 September 1999, Boston, Massachusetts

This work doesn't have a description yet. Can you add one?

Publish Date
Publisher
SPIE
Language
English
Pages
224

Buy this book

Previews available in: English

Book Details


Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash., USA
Series
SPIE proceedings series ;, v. 3835, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 3835.
Genre
Congresses.
Other Titles
Three dimensional imaging, optical metrology, and inspection V

Classifications

Dewey Decimal Class
681/.25
Library of Congress
TK8315 .T49 1999,

The Physical Object

Pagination
ix, 224 p. :
Number of pages
224

Edition Identifiers

Open Library
OL3581425M
Internet Archive
threedimensional0000unse_k5n4
ISBN 10
0819434280
LCCN
2002277674
OCLC/WorldCat
42905535
Goodreads
5145672

Work Identifiers

Work ID
OL18256327W

Community Reviews (0)

No community reviews have been submitted for this work.

Lists

History

Download catalog record: RDF / JSON
July 31, 2020 Edited by ImportBot import existing book
February 10, 2019 Edited by MARC Bot import existing book
February 4, 2019 Created by MARC Bot import existing book