An edition of Characterization of radiation damage by transmission electron microscopy (2000)

Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series)
Cover of: Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series) by M.L Jenkins, M.A Kirk
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Last edited by ImportBot
July 29, 2014 | History
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An edition of Characterization of radiation damage by transmission electron microscopy (2000)

Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series)

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Publish Date
Publisher
Taylor & Francis
Language
English
Pages
224

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Subjects

Materials, Effect of radiation on, Microscopy, Transmission electron microscopy
Edition Availability
Cover of: Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series)
Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series)
November 21, 2000, Taylor & Francis
Hardcover in English

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Book Details

First Sentence

"Transmission electron microscopy (TEM) is probably the most important and widely used method of characterization in materials science."

The Physical Object

Format
Hardcover
Number of pages
224
Dimensions
9.4 x 6.3 x 0.4 inches
Weight
1.2 pounds

Edition Identifiers

Open Library
OL7971108M
ISBN 10
075030748X
ISBN 13
9780750307482
LibraryThing
8250142
Goodreads
3020896

Work Identifiers

Work ID
OL16970568W

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July 29, 2014 Created by ImportBot import new book