An edition of Terrestrial neutron-induced soft errors in advanced memory devices
(2008)
Terrestrial neutron-induced soft errors in advanced memory devices
by Takashi Nakamura
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| Edition | Availability |
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1
Terrestrial neutron-induced soft errors in advanced memory devices
2008, World Scientific
in English
9812778810 9789812778819
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Book Details
Table of Contents
Introduction
Terrestrial neutron spectrometry and dosimetry
Irradiation testing in the terrestrial field
Neutron irradiation test facilities
Review and discussion of experimental data
Monte Carlo simulation methods
Simulation results and their implications
International standardization of the neutron test method
Summary and challenges.
Edition Notes
Includes bibliographical references (p. 291-315) and index.
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The Physical Object
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| August 17, 2023 | Edited by ImportBot | import existing book |
| December 20, 2020 | Edited by MARC Bot | import existing book |
| July 28, 2014 | Created by ImportBot | import new book |