An edition of Backscattered scanning electron microscopy and image analysis of sediments and sedimentary rocks
(2005)
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
New Ed edition
by David H. Krinsley, Kenneth Pye, Boggs, Sam, Jr., and N. Keith Tovey
- 0 Ratings
- 1 Want to read
- 0 Currently reading
- 0 Have read
Share
×Close
This edition doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
Previews available in: English
| Edition | Availability |
|---|---|
1
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
2011, Cambridge University Press
in English
0511884516 9780511884511
|
zzzz
Libraries near you:
WorldCat
|
|
2
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
2010, Cambridge University Press
in English
0511628897 9780511628894
|
zzzz
Libraries near you:
WorldCat
|
3
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
September 15, 2005, Cambridge University Press
Paperback
in English
- New Ed edition
0521019745 9780521019743
|
aaaa
Libraries near you:
WorldCat
|
Book Details
First Sentence
"During the past two to three decades, the scanning electron microscope (SEM) has become established as an essential tool in the study of sedimentary rocks, sediments, and soils."
Classifications
The Physical Object
ID Numbers
Source records
Community Reviews (0)
Feedback?
| October 4, 2021 | Edited by ImportBot | import existing book |
| July 28, 2014 | Created by ImportBot | import new book |