An edition of Two- and three-dimensional methods for inspection and metrology VI (2008)

Two- and three-dimensional methods for inspection and metrology VI

10-11 August 2008, San Diego, California, USA

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Two- and three-dimensional methods for inspec ...
Peisen S. Huang
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Last edited by ImportBot
December 4, 2010 | History
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An edition of Two- and three-dimensional methods for inspection and metrology VI (2008)

Two- and three-dimensional methods for inspection and metrology VI

10-11 August 2008, San Diego, California, USA

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
SPIE
Language
English

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Subjects
Metrology, Imaging systems, Optical methods, Computer vision, Quality control, Congresses, Optical measurements, Three-dimensional display systems

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Edition Availability
Cover of: Two- and three-dimensional methods for inspection and metrology VI
Two- and three-dimensional methods for inspection and metrology VI: 10-11 August 2008, San Diego, California, USA
2008, SPIE
in English
  • Not in Library
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Book Details

Edition Notes

Includes bibliographical references and author index.

Published in
Bellingham, Wash
Series
Proceedings of SPIE -- v. 7066, Proceedings of SPIE--the International Society for Optical Engineering -- v. 7066.

Classifications

Library of Congress
TA1632 .T89 2008, TA1632.T89 2008

The Physical Object

Pagination
1 v. (various pagings) :

ID Numbers

Open Library
OL24495820M
ISBN 10
0819472867
ISBN 13
9780819472861
LCCN
2010286670
OCLC/WorldCat
268992561

Source records

Library of Congress MARC record
Better World Books record
Library of Congress MARC record

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December 4, 2010 Created by ImportBot initial import