| Record ID | marc_loc_2016/BooksAll.2016.part37.utf8:190945076:1408 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part37.utf8:190945076:1408?format=raw |
LEADER: 01408cam a22003617a 4500
001 2010286670
003 DLC
005 20100924143357.0
008 100406s2008 waua b 101 0 eng d
010 $a 2010286670
020 $a9780819472861
020 $a0819472867
035 $a(OCoLC)ocn268992561
040 $aSCW$cSCW$dBTCTA$dDLC
042 $alccopycat
050 00 $aTA1632$b.T89 2008
082 00 $a681/.25$222
245 00 $aTwo- and three-dimensional methods for inspection and metrology VI :$b10-11 August 2008, San Diego, California, USA /$cPeisen S. Huang, Toru Yoshizawa, Kevin G. Harding, editors ; sponsored and published by by SPIE.
260 $aBellingham, Wash. :$bSPIE,$cc2008.
300 $a1 v. (various pagings) :$bill. ;$c28 cm.
490 1 $aProceedings of SPIE,$x0277-786X ;$vv. 7066
504 $aIncludes bibliographical references and author index.
650 0 $aComputer vision$vCongresses.
650 0 $aImaging systems$vCongresses.
650 0 $aThree-dimensional display systems$vCongresses.
650 0 $aQuality control$xOptical methods$vCongresses.
650 0 $aOptical measurements$vCongresses.
650 0 $aMetrology$vCongresses.
700 1 $aHuang, Peisen S.
700 1 $aYoshizawa, Tōru,$d1939-
700 1 $aHarding, Kevin G.
710 2 $aSPIE (Society)
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 7066.