CMOS SRAM circuit design and parametric test in nano-scaled technologies

process-aware SRAM design and test

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Last edited by ImportBot
January 29, 2010 | History

CMOS SRAM circuit design and parametric test in nano-scaled technologies

process-aware SRAM design and test

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Springer
Language
English
Pages
193

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Previews available in: English

Edition Availability
Cover of: CMOS SRAM circuit design and parametric test in nano-scaled technologies

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Book Details


Edition Notes

Includes bibliographical references and index.

Published in
[Dordrecht]
Series
Frontiers in electronic testing -- 40

Classifications

Dewey Decimal Class
621.38152
Library of Congress
TK7871.99.M44 P38 2008, TK7888.4TK7895.M4, TK7867-7867.5

The Physical Object

Pagination
xvi, 193 p. :
Number of pages
193

ID Numbers

Open Library
OL22565967M
Internet Archive
cmossramcircuitd00pavl
ISBN 13
9781402083624, 9781402083631
LCCN
2008924192
Library Thing
5751492
Goodreads
5028070

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History

Download catalog record: RDF / JSON
August 2, 2020 Edited by ImportBot import existing book
June 29, 2019 Edited by MARC Bot import existing book
December 4, 2010 Edited by Open Library Bot Added subjects from MARC records.
January 29, 2010 Edited by WorkBot add more information to works
December 11, 2009 Created by WorkBot add works page